Spectroscopic ellipsometry is an ideal technique to characterize film thicknesses and optical constants for photovoltaic applications. Spectroscopic ellipsometers are also sensitive to the presence of rough overlayer and graded optical constants. The technique provides the advantage to be fast, simple to operate and non-destructive for the characterization of the samples. 研究級經(jīng)典型橢偏儀 UVISEL